XRF6 X-Ray fluorescence Persee

Introduction:
X-ray fluorescence (XRF) analysis is a non-destructive method that can test the secondary characteristic x-rays (x-ray fluorescence) generated by the sample when the primary x-ray exciting the sample. This method can realize the fast measurement of the solid and liquid samples. XRF6 EDXRF Spectrometer is PERSEE’s new type of high-end analytical instrument. It combines years of experience elements testing with unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job. XRF6 can be widely used in the field of materials, electronics, chemical, metallurgy, environmental protection, mining and so on.

Features:

• Detector: SDD (Silicon Drift Detector) detector; High-quality energy resolution.
• Digital multi-channel technology: XRF6 use the industry’s most advanced technology which can provide higher detection limit and accuracy.
• X-ray tube and system design: high-power x-ray tube and well system design provide excellent precious metal excitation and work efficiency.
• Data processing systems: special design application software, user-friendly interface.
• Collimating optical system: automatic replacement collimated optical system can meet a variety of user requirements.
• Sample observation systems: CCD camera.
• Shutter system: Replace the sample without closing high pressure; improve test efficiency and accuracy; the interlock design can ensure the safety of operator.